
Technical Specifications
Lloyd Instruments LD Series Technical Specifications
Specification | Value |
---|---|
Force Capacity | LD5: 5 kN (1124 lbf) | LD10: 10 kN (2248 lbf) | LD30: 30 kN (6744 lbf) | LD50: 50 kN (11240 lbf) | LD100: 100 kN (22480 lbf) |
Crosshead Speed Range | LD5/10: 0.0001 to 1270 mm/min | LD30: 0.0001 to 1000 mm/min | LD50: 0.0001 to 500 mm/min | LD100: 0.0001 to 250 mm/min |
Speed Accuracy | 0.1% |
Crosshead Travel | Standard Height: 1070 mm / 42 in | Extended Height: 1669 mm / 65.7 in |
Extension Resolution | LD5/10: 0.000354 micron per encoder count | LD30: 0.000214 micron | LD50: 0.000121 micron | LD100: 0.000063 micron |
Load Cell Accuracy | < ± 0.5% of reading down to 1/100 of load cell capacity |
Load Resolution | 32-bit A/D converter |
Min Load Resolution | 1 part in 10⁹ |
Extensometer Inputs | Analog and Digital |
Data Transfer Rate to PC | 1 kHz |
Supply Voltage | 207-253 VAC at 50 Hz or 103.5-126.5 VAC at 60 Hz |
Load Measuring System | EN ISO 7500-1:2015, Class 0.5 ASTM E4 |
Frame Type | Ultra stiff dual column frame |
Load Cell Type | Pancake load cells |
Interface | CANBUS Interface |
Manufacturing | Made in the USA |
Built-in Storage | Drawer for grip and tool storage |
Mounting System | T-Slot molded into frame |
Model Comparison
Model | Force Capacity | Speed Range | Extension Resolution |
---|---|---|---|
LD5 | 5 kN (1124 lbf) | 0.0001 to 1270 mm/min | 0.000354 micron per encoder count |
LD10 | 10 kN (2248 lbf) | 0.0001 to 1270 mm/min | 0.000354 micron per encoder count |
LD30 | 30 kN (6744 lbf) | 0.0001 to 1000 mm/min | 0.000214 micron per encoder count |
LD50 | 50 kN (11240 lbf) | 0.0001 to 500 mm/min | 0.000121 micron per encoder count |
LD100 | 100 kN (22480 lbf) | 0.0001 to 250 mm/min | 0.000063 micron per encoder count |
Available Accessories
Accessory | Description |
---|---|
Video Extensometers | Non-contact strain measurement |
Contacting Extensometers | Direct contact strain measurement |
Splinter Shields | Safety protection during testing |
Thermal Cabinet | Temperature-controlled testing environment |
Pogo System | Testing very large samples |
Robotic Arms | Automated sample handling |