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FTA-D4000 – Dual Detector – Dual-sided Contour Stylus Type Measurement Systems Mitutoyo - Indicate Technologies

FTA-D4000 – Dual Detector – Dual-sided Contour Stylus Type

A measuring system has been developed that combines a hybrid dual detector and a dual-sided contour stylus for accurately measuring surface roughness. This system offers improved measurement speed and efficiency, along with automation features to enhance ease of use. It provides a diverse array of features and can be expanded with optional detectors for added functionality.
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Product Features 

The ability to hot swap enables the machine to switch between the contour detector and roughness detector without needing to turn off the power.

The tool-less replacement mechanism employs a thumb-turn clamp, allowing for significantly faster switching between detectors.

The stylus drop detection feature identifies and stops the measurement operation if the stylus experiences an abrupt drop.
fta-d4000-dual-detector-dual-sided-contour-stylus-type-measurement-systems-mitutoyo-indicate-technologies-343644
The collision monitoring system for the magnet arm and detector cover guarantees secure measurements even during fast movements.

Optional accessories for automatic measurement streamline processes from setup to measurement by automating them.

Technical Specifications

Benefits

Technical Data

Benefits
The Formtracer Avant D4000 is a comprehensive system that combines a surface roughness and contour detector. This versatile machine allows for effortless swapping of the detector without requiring the machine to be powered off.

Specifically, the FTA-D4000 model is equipped with a dual-sided stylus that enables measurements of inner diameters and the calculation of pitch diameters. 

The dual-sided stylus also offers continuous measurement of both upper and lower surfaces, facilitating faster and easier data analysis of complex features, such as the diameter of an internal screw thread.
fta-d4000-dual-detector-dual-sided-contour-stylus-type-measurement-systems-mitutoyo-indicate-technologies-343644
Technical Data
Resolution X-Axis:
1.97μin / .05μm

Measuring Method:
Ultra high precision linear encoder

Drive speed (software):
0 - 3.1in/s / 0 - 80mm/s

Drive speed (joystick):
0 - 1.57in/s / 0 - 40mm/s

Measuring Speed:
.00078 - 1.18 in/s / .02 - 30 mm/s

Measuring direction (Surface):
Backward

Detector Z-Range (Surface):
320, 3200, 32000μin / 8, 80, 800μm

Detector Z-resolution (Surface):
.004, .04, .4μin / .0001, .001, .01μin

Detection Method (Surface):
Differential inductance

Skid Radius of Curvature:
1.57"

Measuring Force (Surface):
.75mN

Stylus tip (Diamond, angle °/ tip radius) (Surface):
30μm

X-axis inclination angle:
±45°

Z1-Axis Detector Measuring Range (Contour):
2.4" / 60mm

Z1-Axis Detector Measuring Method (Contour):
RT detector

Z1-Axis Detector Resolution (Contour):
.78μin / .02μm

Measuring Direction (Contour):
Forward/Backward

Measuring Force (Contour):
10, 20, 30, 40, 50mN

One-sided cut Stylus tip (angle °/ radius) (Contour):
12°/ 1000μin / 12°/ 25μm

Duel-sided cut Stylus tip (angle °/ radius) (Contour):
30°/ 1000μin / 30°/ 25μm

Column resolution:
39.4μin

Column Resolution:
1μm

Z2-axis Measuring Method:
ABS linear encoder

Column Z2-axis drive speed (Software):
0 - 1.2in/s / 0 - 30mm/s
fta-d4000-dual-detector-dual-sided-contour-stylus-type-measurement-systems-mitutoyo-indicate-technologies-343644