Pinnacle Plus Measurement Systems VIEW Micro Metrology - Indicate Technologies
VIEW Micro Metrology
Pinnacle Plus

Ultra-high accuracy dimensional metrology system.

Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/

State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in production environments ranging from clean rooms to factory floors.

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FEATURES
Pinnacle+ Plus’ state-of-the-art linear motion control technology provides the fastest, most reliable platform available for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.
The Pinnacle+ Plus operates with one or more of VIEW’s standard metrology software packages:

  • VIEW Metrology Software (VMS™) is standard on Pinnacle+ Plus and offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
  •  Elements® Electronic Measurements Software software is optional on Pinnacle+ Plus and provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.
  • Measure-X® metrology software is optional on Pinnacle+ Plus, guiding users through measurement routines with its intuitive point and click interfaces.
Technical Specifications
Metrology System — Technical Datasheet
Parameter Standard Optional
XYZ Travel 250 × 150 × 100 mm
Load Capacity 25 kg
Imaging Optics Single magnification, fixed lens optics with VIEW 1X back tube and VIEW 2.5X objective lens Dual magnification fixed lens optics with VIEW 2.5X objective lens. Optional objective lenses: 0.8X, 1X, 5.0X, 10X, and 25X
Metrology Camera 2.0 megapixel (1628 × 1236), digital, monochrome Color and other camera configurations are optionally available
Illumination Programmable LED illumination system for coaxial through-the-lens surface light, below-the-stage backlight, and multicolor ring light with motorized incidence angle control Grid Autofocus System
Sensor Options Through-the-lens (TTL) laser
Rainbow Probe™ off-axis white light range sensor
Measurement Modes High Speed Move and Measure (MAM) Continuous Image Capture (CIC)