Hybrid, wireless, metrology-grade 3D scanner

Artec Neo revolutionizes quality inspection and reverse engineering, delivering 
metrology-grade accuracy where the design demands it with high-resolution and 
full-color 3D capture of the entire part. Measure what matters. Capture 
everything. 

SKU ITI-ARTC-NEO
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0.025 mm
accuracy
0.05 mm
resolution
100%
wireless
Tolerance-driven 3D scanning for inspection and reverse engineering
Meet Artec Neo, a hybrid, wireless handheld 3D scanner engineered for metrology-grade accuracy of 0.025 mm. Artec Neo covers virtually any reverse engineering and inspection task with a single device: scan with targets where tolerances must hold, capture target-free when speed matters, and get true-to-life color and fine 0.05 mm resolution to document surface condition — all in one scan, one dataset.

Tethered or fully wireless, Artec Neo gives quality and engineering teams the freedom to work anywhere. Every unit is verified in Artec’s independent metrology laboratory in accordance with VDI/VDE 2634 Part 3 — so you can make critical measurement decisions with confidence.
Artec Neo offers the best of two scanning worlds: accuracy, speed, color & resolution
Until now, users had to choose between target-based laser scanning accuracy and the speed, detail, and color of structured light. Now, you don’t have to compromise — Artec Neo offers it all in one device.
Artec Neo: Metrology follows design intent
With Artec’s proprietary blue-light optics and a single hybrid tracking architecture, Artec Neo tracks geometry, texture, and color across the complete scan, with targets serving as metrology anchors only where critical tolerances demand guaranteed accuracy. Precision follows design intent, just like it does in GD&T.
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Technical Specifications
Datasheet — Technical Specifications

Technical Specifications

Resolution & Accuracy

Accuracy (with targets)0.025 mm (0.001 in)
Volumetric accuracy (with targets)0.025 mm + 0.035 mm/m (0.001 in + 0.0014 in/ft)
Accuracy (without targets)0.050 mm (0.002 in)
Volumetric accuracy (without targets)0.050 mm + 0.3 mm/m (0.002 in + 0.036 in/ft)
Mesh resolution0.050 mm (0.002 in)
Acceptance testVDI/VDE 2634 part 3*

Scanning Range

Size of scanning object/areaS – M
Working distance0.19–0.3 m (7.48–11.81 in)
Volume capture zone1,800 cm³ (109.84 in³)
Linear field of view H×W @ closest range128 × 104 mm (5.04 × 4.09 in)
Linear field of view H×W @ furthest range171 × 152 mm (6.73 × 5.98 in)
Depth of field110 mm (4.33 in)

Speed

3D reconstruction rate for real-time fusion, up to15 fps
Data acquisition speed, up to8 mln points/s

Scanning Algorithms

Target compatibilityYes
Target-free geometry and texture trackingYes
Hybrid (target & target-free 3D scanning) modeYes

Texture

Texture resolution5 MP
Colors24 bpp

Hardware

Scanner typeHandheld
Power sourceAC/DC power adapter, DC 24 V
InterfaceThunderbolt 3, compatible with Thunderbolt 4 hosts
3D structured-light source450 nm, blue LED
Texture illumination sourceWhite LED CRI > 95, color temperature 4000 K
Dimensions H×D×W187 × 156 × 118 mm (7.36 × 6.14 × 4.65 in)
Weight1.3 kg (2.9 lb) with batteries
Warranty2 years

Compatibility

Supported OSWindows 11
Recommended computer parameters13th or 14th Gen Intel Core i7 or i9 processor, RTX 4070 8 GB
Minimum computer requirements12th Gen Intel Core i9 processor, RTX 4060 8 GB

Output & File Formats

3D meshOBJ, PLY, WRL, STL, AOP, ASC, PTX, E57, XYZRGB
CADSTEP, IGES, X_T
MeasurementsCSV, DXF, XML

* Accuracy verified per VDI/VDE 2634 part 3.

Measure what matters. Capture everything.
One scanner, many scenarios — apply reference targets to suit your task, from a full field to none at all. Every scenario ends in a single complete dataset with anchored accuracy and every detail captured.
First article inspection · Golden samples
Achieve metrology-grade accuracy everywhere: full target coverage.
Targets across the whole part keep every frame anchored — with Artec Neo reaching 0.025 mm + 0.035 mm/m volumetric accuracy over the entire surface.
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Reverse engineering · Validation
Capture complete objects with metrology-grade accuracy on toleranced features.
Targets go around the features that perform a function — datums, fits, interfaces — anchoring accuracy exactly where it has to hold, with other surfaces captured target-free with full detail and color.
Inspection · Dimensional control
Inspect critical surfaces without covering them with targets.
Targets go on the fixture, not the part — the setup carries the metrology-grade accuracy framework, with no error accumulation across the measurement.

Even deep channels and passages, where targets can’t be applied, are measured as-is to be compared against CAD.
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Assembly · Retrofitting · Machine installation
Measure features relative to each other — without scanning everything in between.
A target trail links connecting points into one common frame of reference — scan the trail first, then just the features that matter.

Capture vital engineering data — flange-to-flange distances, bolt-circle orientation, and mounting-point coordinates over several meters with metrology-grade accuracy.
Design · Prototyping · 3D modeling
Accurate and fast capture, no targets at all.
Scan entire objects in minutes with up to 0.05 mm accuracy and resolution — no target placement or surface preparation required.

Get clean meshes ready for CAD, as well as full-color part scans carrying numbers, casting marks, and surface condition.
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High resolution & accuracy. Half the lead time.
Artec Neo excels at capturing fine detail in ultra-high resolution while maintaining metrology-grade accuracy, without slowing down like standard laser scanners.
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And where cables can’t go — Artec Neo goes anyway.
With a built-in battery and Wi-Fi, Artec Neo gives users the freedom to scan continuously where running a cable wouldn’t be feasible for on-site inspection, scanning at height, and capturing in confined spaces.
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40–50 mins.
continuous scanning
2 batteries
included
6 meters
Wi-Fi range
Verified accuracy. Certified for every unit.
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Tested per international standards
Acceptance testing is done per VDI/VDE 2634 Part 3, using robot-driven trajectories and internationally traceable reference objects.
Independent laboratory
Artec’s dedicated metrology laboratory, operating according to ISO/IEC 17025 principles, with safeguards for impartiality.
Per-unit certificate
Every Neo is individually calibrated and verified before shipment, and ships with its own accuracy certificate.