Enhance the contact contouring capabilities of your OGP system by integrating the SP25M scanning probe. This user-friendly feature enables you to effortlessly define a start and end point, and the scanning probe seamlessly traces the part profile between these points.
Empowered by intelligent algorithms, the ZONE3® metrology software directs the probe, swiftly tracking the part contour and capturing data points at a velocity and sampling rate specified by the user. The scanning probe dynamically adjusts point density when navigating curves, resulting in significant reductions in both programming and measurement times compared to single-point probing methods.
On SmartScope systems, scanning probes are strategically positioned in fixed locations, offset from the optics. Optionally, they can be integrated with automatic deployment mechanisms and articulating heads on specific systems for added flexibility.
For increased efficiency, optional change racks enable the automatic exchange of different probes within a program without requiring any operator intervention. Kinematic mounts facilitate the attachment and detachment of change racks without the need for subsequent relocation.
SUPPORTED TOUCH PROBES
SP25M, TM25-20, and PAA1
MOUNTING
Standard
Fixed position offset from the optics
Optional
Automatic deployment mechanisms and articulating heads on select systems
CHANGE RACK
3 or 6-position
